Method and apparatus for automatic measurement of various qualities of printed sheets

ABSTRACT

Embodiments of the invention relate to the automatic measuring of such qualities of a printed sheet as reflectance excluding specular reflectance, reflectance including specular reflectance, e.g. gloss, transmittance, half-tone coverage, and the like.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a divisional of U.S. patent Ser. No. 14/151,703,filed Jan. 9, 2014, which application is incorporated herein in itsentirety by this reference thereto.

BACKGROUND OF THE INVENTION

1. Technical Field

The invention relates to printing. More particularly, the inventionrelates to the measuring of qualities of a printed sheet, for example,reflectance excluding specular reflectance, reflectance includingspecular reflectance, e.g. gloss, transmittance, and half-tone coverage.

2. Description of the Background Art

Many factors affect the qualities of an image that is printed on asheet. Such phenomena as reflection and transmittance of light occurbecause the frequencies of the light waves do not match the naturalfrequencies of vibration of the objects. When light waves of thesefrequencies strike an object, such as a sheet of paper, the electrons inthe atoms of the object begin vibrating. But instead of vibrating inresonance at a large amplitude, the electrons vibrate for brief periodsof time with small amplitudes of vibration; then the energy is reemittedas a light wave. If the object is transparent, then the vibrations ofthe electrons are passed on to neighboring atoms through the bulk of thematerial and reemitted on the opposite side of the object. Suchfrequencies of light waves are said to be transmitted. If the object isopaque, then the vibrations of the electrons are not passed from atom toatom through the bulk of the material. Rather the electrons of atoms onthe material's surface vibrate for short periods of time and then reemitthe energy as a reflected light wave. Such frequencies of light are saidto be reflected.

The color of the objects that we see is largely due to the way thoseobjects interact with light and ultimately reflect or transmit it to oureyes. The color of an object is not actually within the object itself.Rather, the color is in the light that shines upon it and is ultimatelyreflected or transmitted to our eyes. The visible light spectrumconsists of a range of frequencies, each of which corresponds to aspecific color. When visible light strikes an object and a specificfrequency becomes absorbed, that frequency of light never makes it toour eyes. Any visible light that strikes the object and becomesreflected or transmitted to our eyes contributes to the color appearanceof that object. Thus, the color is not in the object itself, but in thelight that strikes the object and ultimately reaches our eye. The onlyrole that the object plays is that it might contain atoms capable ofselectively absorbing one or more frequencies of the visible light thatshine upon it. If an object absorbs all of the frequencies of visiblelight except for the frequency associated with green light, then theobject appears green in the presence of visible light. If an objectabsorbs all of the frequencies of visible light except for the frequencyassociated with blue light, then the object appear blues in the presenceof visible light.

Reflectivity is a directional property. Most surfaces can be dividedinto those that give specular reflection and those that give diffusereflection. For specular surfaces, such as glass or polished metal,reflectivity is nearly zero at all angles except at the appropriatereflected angle. That is, reflected radiation follows a different pathfrom incident radiation for all cases other than radiation normal to thesurface. For diffuse surfaces, such as matte white paint, reflectivityis uniform; radiation is reflected in all angles equally ornear-equally. Such surfaces are said to be Lambertian. Most real objectshave some mixture of diffuse and specular reflective properties.

Gloss is an optical property describing the ability of a surface toreflect light into the specular direction. The factors that affect glossare the refractive index of the material, the angle of incident lightand the surface topography. Gloss is one of the factors that describethe visual appearance of an object. Factors that affect gloss include,for example, the refractive index of the material, the angle of incidentlight relative to the surface of the material, and the material'ssurface topography. Very rough surfaces, such as chalk reflect nospecular light and appear dull. Gloss is also expressed as luster inmineralogy, or sheen in certain fields of application.

The appearance of gloss depends on a number of parameters which includethe illumination angle, refractive index, surface condition, andobserver characteristics. Primarily light is reflected from a surface inone of two ways. In specular reflection, the angle of the lightreflected from the surface is equal and opposite to the angle of theincident light. A diffuse reflection scatters the incident light over arange of directions. Variations in surface texture influence specularreflectance levels. Objects with a fine surface texture, i.e. highlypolished and smooth, allow a high percentage of light to be reflectedfrom their surfaces making them appear shiny to the eye. This is due toa greater amount of incident light striking the surface being reflecteddirectly back to the observer; the majority of which being reflected inthe specular direction.

Conversely, objects with rough surfaces cause the light to be deflectedat different angles according to the surface profile resulting in ascattering of light away from the angle of reflection. This causes theobject to appear dull or matte.

The image forming qualities are much lower making any reflection appearblurred. The higher the degree of surface roughness, the greater thescattering of light resulting in a lower gloss level.

Due to the refractive index, the type of substrate material also has animportant effect on the amount of specular reflection from its surface.Nonmetallic materials such as dielectrics and insulators, i.e. plasticsand coatings, produce a higher level of reflected light when illuminatedat a greater illumination angle due to light being absorbed into thematerial or being diffusely scattered depending on the color of thematerial. Metals, e.g. conductors, do not suffer from this effectproducing higher amounts of reflection at any angle than nonmetals

Further, many different phenomena influence the reflection spectrum of,for example, a color halftone patch printed on a diffusely reflectingsubstrate, e.g. paper. These phenomena comprise the surface reflectionat the interface between the air and the paper, light scattering andreflection within the substrate, i.e. paper bulk, and the internalreflections at the interface between the paper and the air. The lateralscattering of light within the paper substrate and the internalreflections at the interface between the paper and the air areresponsible for what is generally called the optical dot gain. Inaddition, due to the printing process, the deposited ink surfacecoverage is generally larger than the nominal coverage, yielding aphysical or mechanical dot gain. Effective ink surface coverage dependon the inks, on the paper, and also on the specific superposition of thedifferent inks.

As can be seen from the foregoing, the physics of light in connectionwith the printing of an image on a sheet is complex. It would beadvantageous to be able to measure any one or more of the foregoingqualities quickly and accurately in situ and use the results of suchmeasurements to enhance the process of printing in both real time and toparameterize the printing process.

SUMMARY OF THE INVENTION

Embodiments of the invention relate to the automatic measuring of suchqualities of a printed sheet as reflectance excluding specularreflectance, reflectance including specular reflectance, e.g. gloss andmetallic reflectance, transmittance, half-tone coverage, and the like.

In an embodiment, a computer implemented method is provided forautomatic measurement of reflectance, in which one or more spectralsensors are used to measure spectral reflectance at at least multipleangles, e.g. typically two to five angles, relative to a sheet for eachof a plurality of colored patches on said sheet (fingerprint). Forpurposes of the discussion herein, a fingerprint is embodied in astandardized or customized print target that can have up to hundreds ofcolor patches, made by a combination of mixing primary colors. All ofthese combinations are generally limited, e.g. by sub-sampling, incomparison to the total quantity of combinations drivable by the device,e.g. ≈1000 combinations for 4294 billions (256̂4) if printing with fourcolors.

Printing this sub-sampled device combination results in, after printingand measurement, a sub-sampled color description of the device in acertain configuration, e.g. media, screens, ink density, hardwaresetting, etc.

Then, a color look-up table (CLUT) is computed to define thecolorimetric value generated by a device color combination. The reserveCLUT, e.g. colorimetric space to printer device, is also computed. TheseCLUTs could be saved as a ICC profile. Many methods for creating ICCprofiles could be used. The ICC profile file is used to predict thecolor of a certain device combination and to define a device combinationfor reproducing a certain color. In embodiments of the invention, thecolored patches on the sheet are produced in accordance with thefingerprint of the printer, as determined by the foregoing technique.

In embodiments of the invention, the spectral measurements are processedby a single angle per measurement, where a next angle is measured aftera full measurement of the sheet for a previous angle. In thisembodiment, measurement of each patch is performed by moving any of thesheet, the sensor, or both, preferably in other than X, Y coordinates.

In another embodiment, a computer implemented method is provided forautomatic measurement of reflectance excluding specular reflectance andreflectance including specular reflectance, in which a spectral sensoris used to measure light reflectance at one angle chosen for excludingspecular reflectance, to quantify spectral reflectance in the visiblewavelength, e.g. 400 to 700 nm, for each of a plurality of coloredpatches on a sheet (fingerprint). Three or more sensors are arranged indifferent angles relative to the sheet for simultaneously measuringgloss (1D space) for each of the plurality of colored patches on thesheet. In this embodiment, measurement of each patch is performed bymoving any of the sheet, the sensor, or both, preferably in other thanX, Y coordinates.

In another embodiment, a computer implemented method is provided forautomatic measurement of reflectance and transmittance, in which asingle spectral sensor is used for substantially simultaneouslymeasuring both spectral reflectance and spectral transmittance for eachof a plurality of colored patches on a sheet (fingerprint). In thisembodiment, measurement of each patch is performed by moving any of thesheet, the sensor, or both, preferably in other than X, Y coordinates.

In another embodiment, a computer implemented method is provided forautomatic measurement of reflectance and halftone coverage of a sheetsurface, in which a spectral sensor is used to measure spectralreflectance for each of a plurality of colored patches on a sheet(fingerprint), and in which with a color camera is used forsimultaneously measuring halftone coverage of a surface of the sheet. Aprocessor uses these measurements of halftone coverage of a surface ofthe sheet and applies a numerical filter (color) to perform imageanalysis and thus determine a threshold estimate of surface coverage byan ink dot. In this embodiment, measurement of each patch is performedby moving any of the sheet, the sensor, or both, preferably in otherthan X, Y coordinates.

In another embodiment, a computer implemented method is provided forautomatic substrate detection in which a spectral sensor is used fordetecting automatically what type of substrate is in a printer bymeasuring each of reflectance, transparency, and specular reflectanceand/or gloss (three angles) using a light source comprising any ofvisible light similar to daylight (one source) or at least two coloredlight sources. Responsive to such substrate detection, the methodautomatically loads a new technical setup into the printer and/orprovides a warning to a user. A combination of all information obtainedby these measurements results in a unique ID for each substrate. Thesemeasurements are then processed to estimate any of substrate color,substrate opacity, substrate gloss/mat scale, and substrate roughness ortexture.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1A is a block schematic diagram showing automatic measurement ofspectrum reflectance for five angles for all the colored patches presenton one sheet according to a first embodiment of the invention;

FIG. 1B is a block schematic diagram showing automatic measurement ofspectrum reflectance for five angles for all the colored patches presenton one sheet according to an alternative embodiment of the invention;

FIG. 2 is a flow diagram that shows a technique for making spectralreflectance measurements according to the invention;

FIG. 3 is a schematic representation of a sheet having a plurality ofpatches thereon according to the invention;

FIGS. 4A and 4B are schematic diagrams showing alternate embodiments ofa measurement mechanism for a measurement device having a moving head(FIG. 4A) and a measurement device having a moving sheet (FIG. 4B)according to the invention;

FIG. 5 is a block schematic diagram that shows a mechanism for specularreflectance measurement and spectral reflectance excluding specularreflectance according to the invention;

FIG. 6 is a flow diagram that shows the measurement of specularreflectance measurement and spectral reflectance excluding specularreflectance with multiple light sources at multiple angles relative tothe media surface according to the invention;

FIG. 7 is a block schematic diagram that shows a mechanism for measuringreflectance and transmittance with one spectral sensor according to theinvention;

FIG. 8 is a flow diagram that shows the measurement of reflectance andtransmittance with one spectral sensor according to the invention;

FIG. 9 shows a media surface covered by a halftone image according tothe invention;

FIG. 10 is a block schematic diagram of a mechanism for measuringspectral reflectance and for image capture according to the invention;

FIGS. 11A and 11B are schematic diagrams showing a mechanism for movinga block sensor from a spectral sensor (FIG. 11A) to an image sensor(FIG. 11B) according to the invention;

FIG. 12 is a block schematic diagram showing a mechanism for fastsubstrate detection with regard to color, gloss, and transmittanceaccording to the invention;

FIG. 13 is a block schematic diagram showing a mechanism for fastsubstrate detection with regard to texture quantification according tothe invention;

FIGS. 14A-14C are examples of texture quantification and accompanyingplots of gray values vs. pixel distance according to the invention; and

FIG. 15 is a block schematic diagram that depicts a machine in theexemplary form of a computer system within which a set of instructionsfor causing the machine to perform any of the herein disclosedmethodologies may be executed.

DETAILED DESCRIPTION OF THE INVENTION

Embodiments of the invention relate to measuring such qualities ofcolored surfaces on a flat media, e.g. a printed sheet, as intensity,colorimetric or spectral reflectance, specular reflectance, e.g. gloss,intensity, colorimetric or spectral transmittance, half-tone coverage,and the like. These embodiments include methods and apparatus for themeasurement of:

-   -   Light reflectance excluding specular reflectance, for spectral        and/or colorimetric and/or intensity quantification;    -   Light reflectance including specular reflectance, for gloss        index and/or metallic index and/or intensity quantification;    -   Light transmittance, for spectral and/or colorimetric and/or        intensity quantification; and    -   Half tone coverage of a surface, and substrate detection.

Each of these embodiments is discussed below.

Automatic Multi-Angle Apparatus for the Measurement of Reflectance

Manual measurement of reflectance is known for large apertures (Ø 20mm), for example for automotive coatings, e.g. see the XRITE MA98 andGARDNER BYK MAC products. Automatic measurement of reflectance is alsoknown for one angle, e.g. see the BARBIERI Spectro LFP product. However,such known approaches are of limited, if any, value for makingmeasurements with a printer, e.g. for a Vutek printer, for measuringreflectance, for example, of silver inks (color calibration), or formeasuring reflectance of gloss and/or mat varnish, e.g. the influence ofthe varnish on the underlying color.

An embodiment of the invention provides an automatic multi-angleapparatus for the measurement of reflectance (FIG. 1). A presentlypreferred embodiment provides automatized measurement of reflectance forspectral and/or colorimetric and/or intensity quantification by fiveangles for all the colored patches present on one sheet (fingerprint).

For purposes of the discussion herein, a fingerprint is embodied in astandardized or customized print target that can have up to hundreds ofcolor patches, made by a combination of mixing primary colors. All ofthese combinations are generally limited, e.g. by sub-sampling, incomparison to the total quantity of combinations drivable by the device,e.g. ≈1000 combinations for 4294 Billions (256̂4). Printing thissub-sampled device combination results in, after printing andmeasurement, a sub-sampled color description of the device in a certainconfiguration, e.g. media, screens, ink density, hardware setting, etc.

Then, a color look-up table (CLUT) is computed to define thecolorimetric value generated by a device color combination. The reserveCLUT is also computer for the colorimetric space to the printer device.These CLUTs could be saved as a ICC profile. Many methods for creatingICC profiles could be used. The ICC profile file is used to predict thecolor of a certain device combination and to define a device combinationfor reproducing a certain color. In embodiments of the invention, thecolored patches on the sheet are produced in accordance with thefingerprint of the printer, as determined by the foregoing technique.

FIG. 1A is a block schematic diagram showing automatic measurement ofspectrum reflectance for five angles for all the colored patches presenton one sheet according to a first embodiment of the invention. As shownin FIG. 1A, at least one spectral sensor 10 is used to make spectralreflectance measurements. The system processes these measurements by oneangle per measurement. An optical emitter 11, coupled to an opticalcommutator 12 communicates each measured signal to the spectral sensorfrom each of five optical receivers 13, 14, 15, 16, 18. The opticalreceivers measure reflectance of light from a light source 17 from thesurface of a measured medium 19.

FIG. 1B is a block schematic diagram showing automatic measurement ofspectrum reflectance for five angles for all the colored patches presenton one sheet according to an alternative embodiment of the invention. Asshown in FIG. 1B, in some case, such as decreasing the cost of thedevice and/or increasing the speed of measurement, it is not necessaryto have spectral reflectance for all o the angles. In this embodiment,only sensor 3 (15), i.e. having a normal angle to the surface and 45° tothe light source 17, is needed as a spectral sensor. In this embodiment,light transfer could use, if needed, an optical fiber and/or lens andoptical components. For the other angles and/or other sensors, it ispossible to use colorimetric sensors, e.g. to measure three bands with astandardized RGB filter, for the other angles; and a light intensitysensor, such as a photodiode, having one wide band centered around 550nm, for the other angles. In such case, it is necessary to compute aratio by taking the normal angle as reference (sensor 3=45/0°).

For the colorimetric sensor, six data points could be used:

-   -   One set of spectral reflectance at the normal angle with the        media; and    -   One colorimetric value computed from spectral reflectance at the        normal angle with the media, and one colorimetric value per the        other angles.

For light intensity sensor, six data points could be used:

One set of spectral reflectance values at the normal angle with themedia; and

-   -   One light intensity value computed from spectral reflectance at        the normal angle with the media, and one light intensity value        per the other angles.

FIG. 2 is a flow diagram that shows a technique for making spectralreflectance measurements according to the invention. In FIG. 2, themeasurement sequence begins 20 and x, y, z, positioning of the printhead is performed for patch measurement 21. In instruction specifies themeasurement, starting with (n)=1 22. The head is positioned for angle(n) 23 and light is emitted from the light source 24. The spectralreflectance is captured 25. The measurement is validated 27 and, if notvalid, a warning message is sent 28; else, the specular value is saved29 and the value (n) is incremented 30 to allow a next measurement to bemade 31. For such subsequent measurements at different angles theoptical commutator is positioned 26. The process then otherwise proceedsas outlined above for each sensor.

When a measurement has been made for each sensor, such that the value of(n) equals the total number of sensors, measurements are made at a nextpatch on the substrate 31. Thus, a new angle is measured after a fullmeasurement of the sheet, i.e. first angle A is measured for all thepatches, then angle B is measured, etc. In an embodiment, an opticalfiber is used to send light to the sheet and return light from thesheet. Further, in a presently preferred embodiment, the size of thepatch measured should be less than 6×6 mm. The measurement of each patchis performed by a movement of the sheet, of the sensor, or both by a setof stepping motors in a mode that is preferably not X, Y. FIG. 3 is aschematic representation of a sheet having a plurality of patchesthereon according to the invention.

FIGS. 4A and 4B are schematic diagrams showing alternate embodiments ofa measurement mechanism for a device measurement having a moving head(FIG. 4A) and a device measurement having a moving sheet (FIG. 4B)according to the invention. In FIG. 4A, a measurement head 40 is placedfor movement as part of a moving head assembly 42 in the x and ydirections relative to a sheet having a plurality of patches formedthereon 41. In FIG. 4B, a measurement head 40 is placed in a stationaryarrangement and a sheet having a plurality of patches formed thereon 41is positioned in the x and y directions relative to the measurement headby a moving sheet assembly 43

Automatic Multi-Angle Apparatus for the Measurement of Visible SpectralReflectance and Specular Reflectance

Manual measurement of specular gloss is known for large apertures, e.g.Ø 20 mm, from a single angle, for example for automotive coatings, e.g.see the GARDNER spectro-guide product, which measures 45/0 gloss.However, such known approaches are of limited, if any, value for makingmeasurements with a printer, e.g. for a Vutek printer, for measuringreflectance, for example, of silver inks (color calibration), or formeasuring reflectance of gloss/mat varnish, e.g. the influence of thevarnish on the underlying color.

An embodiment of the invention provides an automatic multi-angleapparatus for the measurement of specular reflectance excluding specularlight, and spectral or colorimetric or intensity reflectance includingspecular light. In a presently preferred embodiment, automaticmeasurement is made of light reflectance for color (spectral space) andgloss (1D space) for all the colored patches present on one sheet(fingerprint). See FIGS. 3, 4A, and 4B. Embodiments of the inventioninclude, for example, a moving head in the x, y axis with a staticsheet; a moving sheet in the x, y axis with a static head; and acombination of movements, including a moving head and a moving sheet inthe x, y axis

To adjust the distance between the measuring head and the sheet, a zmovement is needed, this is accomplished manually, by operation of amotor, or by a combination of both. The movement of the head and/orsheet is effected in accordance with the size of the patch and thedistance between each patch. In embodiments of the invention, thisinformation includes, for example, defining movement before themeasurement is made as coordinates in a file, e.g. x, y, x size, y size,that are sent to the printer to provide instructions for removal andcarriage movement; or using an optical detector for carriage movement,e.g. where patch transition is detected by contrast between the patchesand the sheet and/or by a high contrast grid, for example a line inblack printed on a white substrate.

In an embodiment, color is measured for one angle, e.g. 45/0° and glossis measured for three or more angles. One spectral sensor is used tomeasure color and three or more sensors are arranged in different anglesto measure light only (one dimension) for gloss information.

FIG. 5 is a block schematic diagram that shows a mechanism for spectralmeasurement according to the invention. In FIG. 5, a plurality of lightsources 51, 52, 53, are placed at different angles relative to thesurface of the media 41. Respective light sensors 56, 55, 54, collectlight from these lights sources as it is reflected from the surface ofthe media. A spectral sensor 50 is also provided to collect colorinformation with regard to light from, for example light source 2 (52),that is reflected by the media.

In an embodiment, an optical fiber is used to send light to the sheetand return light from the sheet. Further, in a presently preferredembodiment, the size of the patch measured should be less than 6×6 mm.The measurement of each patch is performed by a movement of the sheet,of the sensor, or both by a set of stepping motors in a mode that ispreferably not X, Y.

FIG. 6 is a flow diagram that shows the measurement of spectralreflectance for multiple light sources at multiple angles relative tothe media surface according to the invention. In FIG. 6, measurement iscommenced 60 and x, y, z positioning of the head is effected for patchmeasurement 61. Light is emitted from the light source that is used forthe spectral reflectance measurement 62, in this case light source 2.Spectral reflectance is captured by a corresponding specular sensor 63and a validation is performed 64. If validation is successful, thespectral value is saved 65. Specular light is also captured from thislight source 75 and a validation is performed 76. If successful, thespecular value is saved 70, else a warning message is sent 77.

After the spectral reflectance value is saved 65, a further validationis performed to confirm that the value was successfully saved 66. If so,the light is emitted from another light source 67, in this case lightsource 1. Specular light is captured for this lights source by acorresponding specular sensor 68 and a validation is performed 69. Ifvalidation is successful, then the value is saved 70 and light isemitted from another light source 71, in this case light source 3.Specular light is captured for this lights source by a correspondingspecular sensor 72 and a validation is performed 73. If validation issuccessful, then the value is saved 70, the next patch is measured 74,and the process repeats.

Embodiments of the invention provide a low cost solution when comparedto devices that are used for multi-angle spectral measurement, and theinvention is thus preferably dedicated for measurement ofglossy/specular effects.

Apparatus and Process for the Measurement of Reflectance andTransmittance in One Phase

An embodiment of the invention provides an apparatus and process for themeasurement of reflectance and transmittance. In an embodiment, anautomatized measurements of spectral reflectance and spectraltransmittance are made simultaneously for one or all of the coloredpatches present on one sheet (fingerprint). In a presently preferredembodiment, one spectral sensor is used for the two measurements, i.e.for reflectance and transmittance.

FIG. 7 is a block schematic diagram that shows a mechanism for measuringreflectance and transmittance with one spectral sensor according to theinvention. In FIG. 7, a first light source 79 illuminates the surface ofthe media 41 and light reflected from the surface of the media iscaptured by the spectral sensor 70 for purposes of measuringreflectance; a second light source 80 positioned at a back of the mediailluminates the media and light transmitted through the media iscaptured by the spectral sensor for purposes of measuring transmittance.

FIG. 8 is a flow diagram that shows the measurement of reflectance andtransmittance with one spectral sensor according to the invention. InFIG. 8, transmittance measurement is shown first, but those skilled inthe art will appreciate that transmittance and reflectance may bemeasured in any order. In this example, transmittance measurementcommences 81 and light is emitted from the light source positionedbehind the media 82, in this case light source 1. Spectral transmittanceis captured 83 and the measurement is validated 84. If validation fails,then a warning message is sent 85; else the spectral value is saved 86.

Reflectance measurement commences by emitting light from the lightsource positioned above the surface of the media 87, in this case lightsource 2. Spectral reflectance is captured 88 and the spectral value issaved 89. Validation is performed on the captured value 90 and ifvalidation fails a warning message is sent 91; else the next patch ismeasured 92.

In an embodiment, an optical block, e.g. optical fiber, lens, etc. isused to send light to the sheet and return light from the sheet.Further, in a presently preferred embodiment, the size of the patchmeasured should be less than 6×6 mm. The measurement of each patch isperformed by a movement of the sheet, of the sensor, or both by a set ofstepping motors in a mode that is preferably not X, Y.

Thus, an embodiment captures information for transparency andreflectance for analysis of the ink and substrate opacity. Thisinformation is especially useful for grand format printers, such as theVutek printer.

Apparatus and Process for the Measurement of Reflectance and HalftoneCoverage of a Surface

It is known to perform a dot coverage estimation, e.g. as performed bythe TECHKON SpectroPlate/Plate measurement device or X-RITE iCPlate2.However, dot coverage estimation alone is only of some use, but does notprovide sufficient information for modern printing applications. Anembodiment of the invention provides an apparatus and process for themeasurement of reflectance and halftone coverage of a surface. In anembodiment, an automatized measurement is made of spectral reflectanceand surface covered by the halftone (see FIG. 9 for all the coloredpatches present on one sheet (fingerprint).

In FIG. 9, the gradient is printed with one ink and made by halftoning.In this example, the reflectance measurement determines the ratio oflight reflected by all of the media surface, i.e. dot and substrate, foreach wavelength detected by the sensor. Due to the surface integration,the halftone, e.g. size of the dot, shape, frequency, etc., is not takenin account for the spectral reflectance. A similar value could beobtained for a surface without halftone. In an embodiment, the camera(image sensor) captures an image of the halftone pattern and determinesthe surface covered by the ink (halftone) on the media, i.e. a ratio ofcovered surface to uncovered surface, and not a ratio of lightreflectance. The light reflected by the surface integrated by theaperture, e.g. 3 mm, is not determined. In embodiments of the invention,a processor applies a numerical filter (color) to perform image analysisand determine a threshold estimate the surface coverage by the ink dot.

FIG. 10 is a block schematic diagram of a mechanism for measuringspectral reflectance and for image capture according to the invention.In a presently preferred embodiment, one spectral sensor 100 is used tomeasure the spectral reflectance and one color camera 102, e.g.1024×1024 pixel, is used for analysis of an imaged surface of the media41, e.g. 2×2 to 1×1 mm with regard to light emitted onto the mediasurface by light source 104, 105. In an embodiment of the invention.light deviation is achieved by a semi-transparent mirror 101, such as abeam splitter, that sends the information from the surface of the mediathrough a lens 103 to the image sensor, e.g. CCD or CMOS matrix. Abenefit of this embodiment is that there is no movement and adisadvantage is that energy may lost through the semi-transparentmirror.

FIGS. 11A and 11B are schematic diagrams showing a mechanism for movinga block sensor from a spectral sensor (FIG. 11A) to an image sensor(FIG. 11B) according to the invention. In FIGS. 11A and 11B, a movingsensor block 110, includes a spectral sensor for color measurement 100and an image sensor 102 and lens 103 for image acquisition. In anembodiment o the invention, the spectral reflectance is first measured(FIG. 11A). The block sensor is then moved to position the image sensorin the same axis as that used for spectral measurement (FIG. 11B). Imageacquisition benefits of this embodiment include that there are no lightenergy losses; risks of this approach may involve the use of movingpieces, e.g. positioning accuracy, wear, etc. In other embodiments ofthe invention, it is possible to move the sheet, and not move the blocksensor. A purpose of the image camera is to get an implied dot area thatis better than what one gets from a traditional dot gain measurement ofa tint relative to 100% and white.

In both cases, one goal is to capture the spectral reflectance and thedot coverage estimation for the same surface, at the same localization.In embodiments of the invention, two sensors are moved in the X, Y, Zdirections, as controlled with high precision by a stepper motor sothat, although the measurements for the two sensors are not madesimultaneously, they are performed for both sensors in the same positionfor all patches, e.g. the spectral reflectance is first measured withone sensor for all patches and the image is then captured with thesecond sensor.

In an embodiment, an optical fiber is used to send light to the sheetand return light from the sheet. Further, in a presently preferredembodiment, the size of the patch measured should less than 6×6 mm. Themeasurement of each patch is performed by a movement of the sheet, ofthe sensor, or both by a set of stepping motors in a mode that ispreferably not X, Y.

Thus, this embodiment captures information regarding halftone and inkvolume variation for spectral reflectance. This information isespecially useful for grand format printers, such as the Vutek printer.

Apparatus and Process for Fast Substrate Detection

An embodiment of the invention provides an apparatus and process forfast substrate detection. An embodiment of the invention automaticallydetects the kind of substrate that is in a printer and proposes any ofan automatic loading of a new technical setup, e.g. curves, ICC, etc.,and/or provides a warning to the user. On the substrate only, generallybefore printing, measurement is made of the reflectance, transparency,and gloss with a visible light near to daylight (one source) or two orthree colored sources, e.g. blue/red and green. In an embodiment, diodeemitting light (DEL) is used for a low cost device.

FIG. 12 is a block schematic diagram showing a mechanism for fastsubstrate detection with regard to color, gloss, and transmittanceaccording to the invention. In FIG. 12, a first light source 120 isprovided and light is transmitted from the light source, through amedium 41, to a sensor 122. The sensor for the first light source may bea trichromatic (RGB) or spectral sensor. A second light source 121 isdirected to the medium surface and light reflected therefrom is detectedby sensors 122 and 123. The sensor 123 is an intensity sensor forspecular reflectance at 45°.

FIG. 13 is a block schematic diagram showing a mechanism for fastsubstrate detection with regard to texture quantification according tothe invention. In FIG. 13, a light source 130 is directed to the mediumsurface. Reflected light is focused through an optical lens 131 onto asensor 132, which may be a grayscale CCD (or CMOS) device arranged as abar or matrix.

FIGS. 14A-14C are examples of texture quantification and accompanyingplots of gray values vs. pixel distance according to the invention.

In an embodiment, an optical fiber is used to send and return light.

The combination of all the information obtained by such measurementsresults in a unique ID for each substrate. By processing themeasurements, it is possible to estimate any of:

-   -   Substrate color;    -   Substrate opacity;    -   Substrate gloss/mat scale; and    -   Substrate roughness or texture.

Data Base Fields

Substrate color is measured with a 45/0° geometry in a colorimetricmode, e.g. using a three RGB sensor, or in spectral reflectance mode.Colorimetric data are then computed from spectral reflectance data. Thedata is saved in CIEL*a*b*) (D50/2°, or in another colorimetric space ifneeded, such as XYZ. This data is referred to herein as REFCLR.

Substrate opacity is measured, in an embodiment of the invention, withone band, e.g. Green band, similar to human intensity perception; orwith three bands, e.g. R,G,B band, similar to the colorimeter colorfilter. The data saved is a measure of relative density, e.g. logarithmof the transmittance, and/or another colorimetric space if needed, suchas XYZ. This data is referred to herein as TRINT.

Substrate gloss unit is measured, in an embodiment of the invention,with one sensor and one source light=one degree, e.g. 60° or 45°, withmore than one sensor and/or light, e.g. three degrees (20°, 60°, 85°).The data saved is a measure of relative density, e.g. logarithm of thereflectance, and/or relative intensity and/or gloss/unit, standardizedafter an internal calibration with an official standard. This data isreferred to herein as GULVL.

Substrate roughness or texture is measured, in an embodiment of theinvention, with one D sensor, such as a CCD bar, and a uniform lightsource in the visible spectrum or a 2D sensor, such as a CCDphotosensor, and a uniform light source in the visible spectrum. Afterprocessing the values, the data is saved. This data is referred toherein as TXTLVL.

In an embodiment of the invention, substrate roughness or texturequantification could be accomplished using Laws Texture Energy Measures(see K. Laws, Textured Image Segmentation, Ph.D. Dissertation,University of Southern California, January 1980) or by another approach.Laws' approach to generating texture features uses local masks to detectvarious types of textures. In this approach, convolution masks of 5×5are used to compute the energy of texture which is then represented by anine element vector for each pixel. The masks are generated from thefollowing vectors:

-   -   L5=[+1 +4 6 +4 +1] (Level)    -   E5=[−1 −2 0 +2 +1] (Edge)    -   S5=[−1 0 2 0 −1] (Spot)    -   W5=[−1 +2 0 −2 +1] (Wave)    -   R5=[+1 −4 6 −4 +1] (Ripple)

Database Creation

In a laboratory condition, e.g. device calibrated, temperature andhydrometry in accordance to the production standard, these parametersare measured for all the media to be used on the printer. Thesemeasurements are saved in a data base (see Table 1, below).

TABLE 1 Database Parameters Media ref Color Opacity Gloss Texture AREFCLR#1 TRINT#1 GULVL#1 TXTLVL#1 B REFCLR#2 TRINT#2 GULVL#2 TXTLVL#2 .. . . . . . . . . . . . . . X REFCLR#X TRINT#X GULVL#X TXTLVL#X

Search Algorithm

A goal of the search algorithm is to find a similar or nearest mediatype by comparison with the existing values saved in the data base,based upon the values [REFCLR, TRINT, GULVL, TXTLVL] measured for amedium. For example, if a white matte paper without texture is loadedinto the printer, where the paper already exists in the data base, thena reference for this media is obtained by processing the measuredvalues, which returns the values from the data base. In another example,if a white matte paper without texture is loaded into the printer, wherethe paper does not exist in the data base, then the nearest, i.e.similar, reference media is identified in the database by processing themeasured values.

For the search algorithm, an embodiment of the invention uses theKD-tree approach. A k-d tree (short for k-dimensional tree) is aspace-partitioning data structure for organizing points in ak-dimensional space. k-d trees are a useful data structure for severalapplications, such as searches involving a multidimensional search key,e.g. range searches and nearest neighbor searches. k-d trees are aspecial case of binary space partitioning trees.

The nearest neighbor search (NN) algorithm aims to find the point in thetree that is nearest to a given input point. This search can be doneefficiently by using the tree properties to quickly eliminate largeportions of the search space.

Searching for a nearest neighbor in a k-d tree proceeds as follows:

1. Starting with the root node, the algorithm moves down the treerecursively, in the same way that it would if the search point werebeing inserted, i.e. it goes left or right depending on whether thepoint is less than or greater than the current node in the splitdimension.2. Once the algorithm reaches a leaf node, it saves that node point asthe current best.3. The algorithm unwinds the recursion of the tree, performing thefollowing steps at each node:

-   -   If the current node is closer than the current best, then it        becomes the current best.    -   The algorithm checks whether there could be any points on the        other side of the splitting plane that are closer to the search        point than the current best. In concept, this is done by        intersecting the splitting hyperplane with a hypersphere around        the search point that has a radius equal to the current nearest        distance. Because the hyperplanes are all axis-aligned this is        implemented as a simple comparison to see whether the difference        between the splitting coordinate of the search point and current        node is less than the distance (overall coordinates) from the        search point to the current best.    -   If the hypersphere crosses the plane, there could be nearer        points on the other side of the plane, so the algorithm must        move down the other branch of the tree from the current node        looking for closer points, following the same recursive process        as the entire search.    -   If the hypersphere does not intersect the splitting plane, then        the algorithm continues walking up the tree, and the entire        branch on the other side of that node is eliminated.        4. When the algorithm finishes this process for the root node,        then the search is complete.

Result

By the kd-tree approach, even if the media measurements do not matchwell with the preset saved in the database, there is still someknowledge of the media and a printer preset can be loaded in accordanceto the media class. For example, if the gloss level is an major valuefor drop volume, the drop volume can be adjusted in accordance to thegloss level, even if the color of the media does not match well with thenearest media in the data base. In embodiments of the invention, asimple warning can be provided to the user if the wrong media, or amedia that is out of tolerance, is loaded. A warning message can also beprovided to save time and media consumption because the print resultmight not otherwise be in accordance to expectations.

Computer Implementation

FIG. 15 is a block schematic diagram that depicts a machine in theexemplary form of a computer system 1600 within which a set ofinstructions for causing the machine to perform any of the hereindisclosed methodologies may be executed. In alternative embodiments, themachine may comprise or include a network router, a network switch, anetwork bridge, personal digital assistant (PDA), a cellular telephone,a Web appliance or any machine capable of executing or transmitting asequence of instructions that specify actions to be taken.

The computer system 1600 includes a processor 1602, a main memory 1604and a static memory 1606, which communicate with each other via a bus1608. The computer system 1600 may further include a display unit 1610,for example, a liquid crystal display (LCD) or a cathode ray tube (CRT).The computer system 1600 also includes an alphanumeric input device1612, for example, a keyboard; a cursor control device 1614, forexample, a mouse; a disk drive unit 1616, a signal generation device1618, for example, a speaker, and a network interface device 1628.

The disk drive unit 1616 includes a machine-readable medium 1624 onwhich is stored a set of executable instructions, i.e., software, 1626embodying any one, or all, of the methodologies described herein below.The software 1626 is also shown to reside, completely or at leastpartially, within the main memory 1604 and/or within the processor 1602.The software 1626 may further be transmitted or received over a network1630 by means of a network interface device 1628.

In contrast to the system 1600 discussed above, a different embodimentuses logic circuitry instead of computer-executed instructions toimplement processing entities. Depending upon the particularrequirements of the application in the areas of speed, expense, toolingcosts, and the like, this logic may be implemented by constructing anapplication-specific integrated circuit (ASIC) having thousands of tinyintegrated transistors. Such an ASIC may be implemented with CMOS(complementary metal oxide semiconductor), TTL (transistor-transistorlogic), VLSI (very large systems integration), or another suitableconstruction. Other alternatives include a digital signal processingchip (DSP), discrete circuitry (such as resistors, capacitors, diodes,inductors, and transistors), field programmable gate array (FPGA),programmable logic array (PLA), programmable logic device (PLD), and thelike.

It is to be understood that embodiments may be used as or to supportsoftware programs or software modules executed upon some form ofprocessing core (such as the CPU of a computer) or otherwise implementedor realized upon or within a machine or computer readable medium. Amachine-readable medium includes any mechanism for storing ortransmitting information in a form readable by a machine, e.g. acomputer. For example, a machine readable medium includes read-onlymemory (ROM); random access memory (RAM); magnetic disk storage media;optical storage media; flash memory devices; electrical, optical,acoustical or other form of propagated signals, for example, carrierwaves, infrared signals, digital signals, etc.; or any other type ofmedia suitable for storing or transmitting information.

Although the invention is described herein with reference to thepreferred embodiment, one skilled in the art will readily appreciatethat other applications may be substituted for those set forth hereinwithout departing from the spirit and scope of the present invention.Accordingly, the invention should only be limited by the Claims includedbelow.

1. A computer implemented method for automatic substrate detection,comprising: with a spectral sensor, automatically detecting what type ofsubstrate is in a printer by measuring each of reflectance,transparency, and gloss from a plurality of angles using a light sourcecomprising any of one visible light source similar to daylight or atleast two colored light sources; responsive to said substrate detection,any of automatically loading a new technical setup into said printer andproviding a warning to a user; wherein a combination of all informationobtained by said measurements results in a unique ID for each substrate;and processing said measurements to estimate any of: substrate color[REFCLR]; substrate opacity [TRINT]; substrate gloss/mat scale [GULVL];and substrate roughness or texture [TXTLVL].
 2. The method of claim 1,further comprising: measuring substrate color with a 45/0° geometry in acolorimetric mode using a three RGB sensor, or in spectral reflectancemode; computing colorimetric data from spectral reflectance data; andsaving said data in CIEL*a*b* (D50/2°), or in another colorimetric spaceif needed.
 3. The method of claim 1, further comprising: measuringsubstrate opacity with one band or with three bands; and savingresulting data as a measure of relative density.
 4. The method of claim1, further comprising: measuring substrate gloss with one sensor and onesource light or with more than one sensor and/or light; and savingresulting data as a measure of relative density and/or relativeintensity and/or gloss/unit, standardized after an internal calibrationwith an official standard.
 5. The method of claim 1, further comprising:measuring substrate roughness or texture with one D sensor and a uniformlight source in the visible spectrum or a 2D sensor and a uniform lightsource in the visible spectrum.
 6. The method of claim 1, furthercomprising: finding a similar or nearest media type by comparison withexisting values saved in a data base, based upon the values [REFCLR,TRINT, GULVL, TXTLVL] measured for a medium.
 7. The method of claim 6,further comprising: using a kd-tree algorithm to find said similar ornearest media type.
 8. An apparatus for automatic substrate detection,comprising: a spectral sensor for automatically detecting what type ofsubstrate is in a printer by measuring each of reflectance,transparency, and gloss from a plurality of angles using a light sourcecomprising any of one visible light source similar to daylight or atleast two colored light sources; a processor configured for, responsiveto said substrate detection, any of automatically loading a newtechnical setup into said printer and providing a warning to a user;said processor configured for a combination of all information obtainedby said measurements to generate a unique ID for each substrate; andsaid processor configured for processing said measurements to estimateany of: substrate color [REFCLR]; substrate opacity [TRINT]; substrategloss/mat scale [GULVL]; and substrate roughness or texture [TXTLVL]. 9.The apparatus of claim 8, further comprising: said processor measuringsubstrate color with a 45/0° geometry in a colorimetric mode using athree RGB sensor, or in spectral reflectance mode; said processorcomputing colorimetric data from spectral reflectance data; and saidprocessor saving said data in CIEL*a*b* (D50/2°), or in anothercolorimetric space if needed.
 10. The apparatus of claim 8, furthercomprising: said processor measuring substrate opacity with one band orwith three bands; and said processor saving resulting data as a measureof relative density.
 11. The apparatus of claim 8, further comprising:said processor measuring substrate gloss with one sensor and one sourcelight or with more than one sensor and/or light; and said processorsaving resulting data as a measure of relative density and/or relativeintensity and/or gloss/unit, standardized after an internal calibrationwith an official standard.
 12. The apparatus of claim 8, furthercomprising: said processor measuring substrate roughness or texture withone D sensor and a uniform light source in the visible spectrum or a 2Dsensor and a uniform light source in the visible spectrum.
 13. Theapparatus of claim 8, further comprising: said processor finding asimilar or nearest media type by comparison with existing values savedin a data base, based upon the values [REFCLR, TRINT, GULVL, TXTLVL]measured for a medium.
 14. The apparatus of claim 13, furthercomprising: said processor using a kd-tree algorithm to find saidsimilar or nearest media type.